Guidelines for Developing Radiation Hardness Assurance Device Specifications
FSC: 59GP
The primary objective of this document is to provide guidelines and easy to follow procedures for the preparation of detailed device specifications for the procurement of microcircuits and semiconductor devices where Radiation Hardness Assurance (RHA) is required.
The guidelines are applicable to MIL-M-38510, MIL-S-19500 microcircuit and semiconductor device detailed specifications as well as to other specifications such as Source Control Drawings (SCD), Selected Item Drawings (SID), Specification Control Drawings (SCD),
and Standardized Military Drawings (SMD). Recommended procedures are provided for characterizing the radiation response of a part and for obtaining post-irradiation end-point limits for qualification and Lot Acceptance Tests (LAT).
Points of Contact:
| |
Document Downloads
MIL-HDBK-816
Guidelines for Developing Radiation Hardness Assurance Device Specifications
Revision: -, Dated: 09 September 1994
File Name: hb816.pdf, File Size: 2914 kb
MIL-HDBK-816 Notice 1
Guidelines for Developing Radiation Hardness Assurance Device Specifications (Change Notice)
Dated: 08 April 2002
File name: hb816not1.pdf, File Size: 203 kb
MIL-HDBK-816 Notice 2
Guidelines for Developing Radiation Hardness Assurance Device Specifications (Validation Notice)
Dated: 11 April 2007
File name: hb816not2.pdf, File Size: 3 kb
Related Items
Comments or questions: VaWebTeam@dla.mil