Ionizing Dose and Neutron Hardness Assurance Guidelines for Microcircuits and Semiconductor Devices
FSC: 59GP
This document addresses the piecepart level system engineering approach to the implementation of an HA program applicable to both neutron and ionizing radiation (ionizing dose) permanent damage derived from nuclear weapon or natural space environments. Recommendations
are included for systems with low to moderate requirements (DMBP method) and for moderate to severe requirements (PCC method). A system of parts categorization based on design margin is presented which provides consistency in parts qualification procedures
and control requirements. Information is provided on sampling and sample sizes, test facilities, qualification and lot acceptance testing, and documentation requirements. Recommendations are made for the use of pieceparts available under the Government sponsored
Radiation Hardness Assured (RHA) device program. Information is also included on peripheral subject matter that is necessary or helpful to an understanding of these guidelines.
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Document Downloads
MIL-HDBK-814
Ionizing Dose and Neutron Hardness Assurance Guidelines for Microcircuits and Semiconductor Devices
Revision: -, Dated: 08 February 1994
File Name: hb814.pdf, File Size: 5350 kb
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